"We have stringent circuit verification requirements to achieve the high resolutions, low light levels, and resulting image quality of our CMOS image sensors," said T.J. Dai, director of analog and layout at OmniVision. "We selected the AFS Platform because it provides the accuracy and speed that enables us to perform full-spectrum device noise analysis to characterize the quality of our single-chip CMOS image sensor designs."
Bekeley DA's white paper on CMOS sensors simulations shows a transient noise simulation of a comparator, apparently in ramp ADC:
 |
| Comparator Output - Eye Diagram Window = 5 periods and Jitter Histogram |
