Workshop on CMOS Active Pixel Sensors for Particle Tracking

University of Bonn, Germany conducts Workshop on CMOS Active Pixel Sensors for Particle Tracking (CPIX14) on Sep. 15-17, 2014. Although the workshop is fully booked, the organizers offer a live broadcast over the Internet for the presenters who agree - the world's first for an image sensor event.

The workshop's agenda:

Technology and design I
  • Overview Technology Offers
    Tomasz Hemperek (Universitaet Bonn (DE))
  • Design and process development of CMOS image sensors with TowerJazz
    Renato Turchetta (STFC - Rutherford Appleton Lab. (GB))
  • APSEL Deep n-well and Deep p-well CMOS Sensors with ST and TowerJazz Technologies
    Gianluca Traversi (University of Bergamo)
Technology and design II
  • Deep n-well CMOS Sensors with 3D Integration of Global Foundries Wafers
    Valerio Re (INFN)
  • DMAPS Design in XFAB Technology
    Tetsuichi Kishishita (University of Bonn)
  • Development of DMAPS Sensors in ESPROS Technology
    Miroslav Havranek (Acad. of Sciences of the Czech Rep. (CZ))
Industrial technology offerings
  • ESPROS technology
    Martin Popp (Espros Photonics)
  • LFoundry Technology
    Gerhard Spitzelsperger (LFoundry)
  • TowerJazz Technology
    Avi Strum (TowerJazz)
CMOS sensors: industry developments
  • Design detail and performance of Fully Depleted Backside Illuminated CMOS Sensors
    Stefan Lauxtermann (Sensor Creations)
  • AMS High Performance CIS Modules
    Ingrid JONAK-AUER (AMS)
  • Rad-hard design in CMOS [image] sensors
    Bart Dierickx (Caeleste)
  • Image Sensor Design and Technology Development at Fraunhofer IMS
    Sasha WEYERS (Fraunhofer IMS)
Technology and design III
  • PERCIVAL: CMOS Image Sensors for Low Energy X-Ray Detection
    Iain Sedgwick (STFC)
  • AMS Designs: CLICPix/CCPD/Mu3e
    Ivan Peric (Ruprecht-Karls-Universitaet Heidelberg (DE))
  • CCPD Design: from AMS to GF technology
    M. Patrick Pangaud (Centre National de la Recherche Scientifique (FR))
Technology and design IV
  • Design of CMOS Pixels Sensor for the STAR Experiment
    Christine Hu (IPHC/IN2P3)
  • STAR MAPS Developments and Experiences
    Leo Greiner (Lawrence Berkeley National Laboratory)
  • Alice Designs: Mistral, Astral, Alpide
    Marc Winter (Institut Pluridisciplinaire Hubert Curien (FR))
Electron microscopy
  • CMOS pixels for electron microscopy: requirements and R&D results at TEAM
    Marco Battaglia (University of California,Santa Cruz (US))
  • Radiation hard MAPS developments for electron microscopy
    Peter Denes (LBNL)
  • CMOS APS for TEM
    Nicola Carlo Guerrini (STFC - RAL)
3D integration and interconnection technologies
  • MAPS are for amateurs, professionals do 3D
    Grzegorz Deptuch (Fermi National Accelerator Lab. (US))
  • Advances in Bonding technologies (chip to wafer and wafer to wafer)
    Ray Yarema (FNAL)
Technology and design V
  • Experience with IBM 130 nm Process for Active CMOS Pixels
    Dario Gnani (LBNL)
  • Fully depleted MAPS: Pegasus and Mimosa 33
    Maciej KACHEL (IPHC)
  • SLAC Developments in CMOS Sensors
    Julie Segal (SLAC)
Technology and design VI
  • X-ray image sensors for SACLA and future Ultimate Storage Ring Light Sources
    Nobukazu Teranishi (University of Hyogo)
  • Lapis SOI Technology and Designs
    Yasuo Arai (High Energy Accelerator Research Organization (JP))
Detector characterization and performance I
  • Characterization of CCPDV3 HV-CMOS sensors capacitively coupled to CLICpix 65 nm CMOS readout ASICs
    Mathieu Benoit (CERN LCD)
  • CMOS MAPS in Planar and 3D Technologies: TID Effects and Bulk Damage Study
    Lodovico Ratti (University of Pavia)
  • Radiation Hardness of the Tower/Jazz 0.18 µm Imaging CMOS Process
    Michael Deveaux (Johann-Wolfgang-Goethe Univ. (DE))
Detector characterization and performance II
  • Design and Characterization of a High-Speed Multi-frame Hybrid CMOS Sensor
    John Porter (Sandia National Laboratories)
  • ESPROS DMAPS: Results and Radiation Hardness
    Theresa Obermann (Universitaet Bonn (DE))

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